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Authors: | Matthias Woehrle, Kai Lampka, Lothar Thiele |
Group: | Computer Engineering |
Type: | Article |
Title: | Conformance testing for cyber-physical systems |
Year: | 2012 |
Month: | December |
Journal: | ACM Transactions in Embedded Computing Systems (TECS) |
Volume: | 11 |
Number: | 4 |
Pages: | 84 |
Keywords: | SN |
Abstract: | Cyber-Physical Systems (CPS) require a high degree of reliability and robustness. Hence it is important to assert their correctness with respect to extra-functional properties, like power consumption, temperature, etc. In turn the physical quantities may be exploited for assessing system implementations. This article develops a methodology for utilizing measurements of physical quantities for testing the conformance of a running CPS with respect to a formal description of its required behavior allowing to uncover defects. We present foundations and implementations of this approach and demonstrate its usefulness by conformance testing power measurements of a wireless sensor node with a formal model of its power consumption. |
Resources: | [BibTeX] [ External LINK ] |